Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits - researchr publication authors

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Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone. Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 7-14, IEEE, 2019. [doi]

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