Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits - researchr publication authors

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André Lange, Fabio A. Velarde Gonzalez, Insaf Lahbib, Sonja Crocoll. Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 186-189, IEEE, 2019. [doi]

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