Erin Lanus, Brian Lee, Luis Pol, Daniel Sobien, Justin Kauffman, Laura J. Freeman. Coverage for Identifying Critical Metadata in Machine Learning Operating Envelopes. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2024 - Workshops, Toronto, ON, Canada, May 27-31, 2024. pages 217-226, IEEE, 2024. [doi]
Abstract is missing.