Marco Lanuzza, Raffaele De Rose, Fabio Frustaci, Stefania Perri, Pasquale Corsonello. Impact of Process Variations on Pulsed Flip-Flops: Yield Improving Circuit-Level Techniques and Comparative Analysis. In René van Leuken, Gilles Sicard, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation - 20th International Workshop, PATMOS 2010, Grenoble, France, September 7-10, 2010, Revised Selected Papers. Volume 6448 of Lecture Notes in Computer Science, pages 180-189, Springer, 2010. [doi]
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