Nicolò Lanza, Alessandro Romeo, Marco Cristani, Francesco Setti. Grain Segmentation in Atomic Force Microscopy for Thin-Film Deposition Quality Control. In Marco Cristani, Andrea Prati 0001, Oswald Lanz, Stefano Messelodi, Nicu Sebe, editors, New Trends in Image Analysis and Processing - ICIAP 2019 - ICIAP International Workshops, BioFor, PatReCH, e-BADLE, DeepRetail, and Industrial Session, Trento, Italy, September 9-10, 2019, Revised Selected Papers. Volume 11808 of Lecture Notes in Computer Science, pages 385-394, Springer, 2019. [doi]
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