Leandro Lanzieri, Jirí Král, Görschwin Fey, Holger Schlarb, Thomas C. Schmidt. Ageing Monitoring for Commercial Microcontrollers Based on Timing Windows. In 29th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2026, Bratislava, Slovakia, April 27-29, 2026. pages 1-5, IEEE, 2026. [doi]
Abstract is missing.