Oumayma Laouini, Ilhem Slama, Faicel Hnaien, Zied Jemaï. Two-stage Stochastic Program for Capacitated Disassembly Lot-sizing Under Random Yield. In IEEE International Conference on Networking, Sensing and Control, ICNSC 2023, Marseille, France, October 25-27, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.