Tracy Larrabee, Jon Colbum. Yield Optimization and Its Relation to Test. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 281-282, IEEE Computer Society, 2001. [doi]
@inproceedings{LarrabeeC01,
title = {Yield Optimization and Its Relation to Test},
author = {Tracy Larrabee and Jon Colbum},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220281abs.htm},
tags = {optimization, testing},
researchr = {https://researchr.org/publication/LarrabeeC01},
cites = {0},
citedby = {0},
pages = {281-282},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}