Kim G. Larsen, Florian Lorber, Brian Nielsen, Ulrik Nyman. Mutation-Based Test-Case Generation with Ecdar. In 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. pages 319-328, IEEE Computer Society, 2017. [doi]
Abstract is missing.