V. Lashkia, S. Aleshin. Test feature classifiers: performance and application. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 341-343, IEEE, 1998. [doi]
Abstract is missing.