Mark Last, Shay Eyal, Abraham Kandel. Effective Black-Box Testing with Genetic Algorithms. In Shmuel Ur, Eyal Bin, Yaron Wolfsthal, editors, Hardware and Software Verification and Testing, First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers. Volume 3875 of Lecture Notes in Computer Science, pages 134-148, Springer, 2005. [doi]
Abstract is missing.