Closed loop control using an IEC 61499 application generator for scan-based controllers

Jose L. Martinez Lastra, Andrei Lobov, L. Godinho. Closed loop control using an IEC 61499 application generator for scan-based controllers. In Proceedings of 10th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2005, September 19-22, 2006, Catania, Italy. IEEE, 2005. [doi]

Abstract

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