Jose A. Rodriguez Latorre, Manuel A. Jimenez, Rogelio Palomera. Automated wafer-level measurement of LDMOS reverse recovery parameters. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 1072-1075, IEEE, 2012. [doi]
Abstract is missing.