Effects of TSVs (through-silicon vias) on thermal performances of 3D IC integration system-in-package (SiP)

John H. Lau, Tang Gong Yue. Effects of TSVs (through-silicon vias) on thermal performances of 3D IC integration system-in-package (SiP). Microelectronics Reliability, 52(11):2660-2669, 2012. [doi]

Abstract

Abstract is missing.