A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS - researchr publication authors

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Tim Lauber, Lantao Wang, Johannes Bastl, Kenny Vohl, Ralf Wunderlich, Stefan Heinen. A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs, 71(3):1581-1585, March 2024. [doi]

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