Tim Lauber, Lantao Wang, Johannes Bastl, Kenny Vohl, Ralf Wunderlich, Stefan Heinen. A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs, 71(3):1581-1585, March 2024. [doi]
@article{LauberWBVWH24,
title = {A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS},
author = {Tim Lauber and Lantao Wang and Johannes Bastl and Kenny Vohl and Ralf Wunderlich and Stefan Heinen},
year = {2024},
month = {March},
doi = {10.1109/TCSII.2023.3343470},
url = {https://doi.org/10.1109/TCSII.2023.3343470},
researchr = {https://researchr.org/publication/LauberWBVWH24},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. II Express Briefs},
volume = {71},
number = {3},
pages = {1581-1585},
}