Eric A. Lauer, Brian D. Corner, Peng Li, Robert M. Beecher, Curtis Deutsch. Repeated-measure validation of craniofacial metrics from three-dimensional surface scans: application to medical genetics. In Brian D. Corner, Roy P. Pargas, Joseph H. Nurre, editors, Proceedings of the Conference on Three-Dimensional Image Capture and Applications V, San Jose, CA, USA, January 19, 2002. Volume 4661 of SPIE Proceedings, pages 177-181, SPIE, 2002. [doi]
@inproceedings{LauerCLBD02,
title = {Repeated-measure validation of craniofacial metrics from three-dimensional surface scans: application to medical genetics},
author = {Eric A. Lauer and Brian D. Corner and Peng Li and Robert M. Beecher and Curtis Deutsch},
year = {2002},
doi = {10.1117/12.460171},
url = {http://dx.doi.org/10.1117/12.460171},
researchr = {https://researchr.org/publication/LauerCLBD02},
cites = {0},
citedby = {0},
pages = {177-181},
booktitle = {Proceedings of the Conference on Three-Dimensional Image Capture and Applications V, San Jose, CA, USA, January 19, 2002},
editor = {Brian D. Corner and Roy P. Pargas and Joseph H. Nurre},
volume = {4661},
series = {SPIE Proceedings},
publisher = {SPIE},
}