Eric A. Lauer, Brian D. Corner, Peng Li, Robert M. Beecher, Curtis Deutsch. Repeated-measure validation of craniofacial metrics from three-dimensional surface scans: application to medical genetics. In Brian D. Corner, Roy P. Pargas, Joseph H. Nurre, editors, Proceedings of the Conference on Three-Dimensional Image Capture and Applications V, San Jose, CA, USA, January 19, 2002. Volume 4661 of SPIE Proceedings, pages 177-181, SPIE, 2002. [doi]
Abstract is missing.