Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing - researchr publication authors

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J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin. Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 465-473, IEEE Computer Society, 1986.

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