J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin. Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 465-473, IEEE Computer Society, 1986.
@inproceedings{LaurentBCC86,
title = {Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing},
author = {J. Laurent and L. Bergher and Bernard Courtois and Jacques P. Collin},
year = {1986},
tags = {testing, analysis, e-science},
researchr = {https://researchr.org/publication/LaurentBCC86},
cites = {0},
citedby = {0},
pages = {465-473},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}