Re-visiting the coupling between mutants and real faults with Defects4J 2.0

Thomas Laurent 0003, Stephen Gaffney, Anthony Ventresque. Re-visiting the coupling between mutants and real faults with Defects4J 2.0. In 15th IEEE International Conference on Software Testing, Verification and Validation Workshops ICST Workshops 2022, Valencia, Spain, April 4-13, 2022. pages 189-198, IEEE, 2022. [doi]

Authors

Thomas Laurent 0003

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Stephen Gaffney

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Anthony Ventresque

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