Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs - researchr publication authors

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F. Lavratti, Leticia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii. Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. In 14th Latin American Test Workshop, LATW 2013, Cordoba, Argentina, 3-5 April, 2013. pages 1-6, IEEE, 2013. [doi]

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