F. Lavratti, Leticia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii. Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. In 14th Latin American Test Workshop, LATW 2013, Cordoba, Argentina, 3-5 April, 2013. pages 1-6, IEEE, 2013. [doi]
@inproceedings{LavrattiBCVM13,
title = {Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs},
author = {F. Lavratti and Leticia Maria Veiras Bolzani and Andrea Calimera and Fabian Vargas and Enrico Macii},
year = {2013},
doi = {10.1109/LATW.2013.6562688},
url = {http://doi.ieeecomputersociety.org/10.1109/LATW.2013.6562688},
researchr = {https://researchr.org/publication/LavrattiBCVM13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {14th Latin American Test Workshop, LATW 2013, Cordoba, Argentina, 3-5 April, 2013},
publisher = {IEEE},
}