An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits - researchr publication

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P. LeCoupanec, William K. Lo, Keneth R. Wilsher. An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits. Microelectronics Reliability, 43(9-11):1621-1626, 2003. [doi]

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