Phong-Phu Le, Shu-Mei Guo, Ju-Chin Chen, Jenn-Jier James Lien. Ball-Grid-Array Chip Defects Detection and Classification Using Patch-based Modified YOLOv3. In 2019 International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2019, Kaohsiung, Taiwan, November 21-23, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.