Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs

Quang Huy Le, Dang Khoa Huynh, Defu Wang, Thomas Kämpfe, Zhixing Zhao, Steffen Lehmann. Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs. In 2nd IEEE 5G World Forum, 5GWF 2019, Dresden, Germany, September 30 - October 2, 2019. pages 7-10, IEEE, 2019. [doi]

Authors

Quang Huy Le

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Dang Khoa Huynh

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Defu Wang

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Thomas Kämpfe

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Zhixing Zhao

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Steffen Lehmann

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