Quang Huy Le, Dang Khoa Huynh, Defu Wang, Thomas Kämpfe, Zhixing Zhao, Steffen Lehmann. Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs. In 2nd IEEE 5G World Forum, 5GWF 2019, Dresden, Germany, September 30 - October 2, 2019. pages 7-10, IEEE, 2019. [doi]
@inproceedings{LeHWKZL19,
title = {Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs},
author = {Quang Huy Le and Dang Khoa Huynh and Defu Wang and Thomas Kämpfe and Zhixing Zhao and Steffen Lehmann},
year = {2019},
doi = {10.1109/5GWF.2019.8911632},
url = {https://doi.org/10.1109/5GWF.2019.8911632},
researchr = {https://researchr.org/publication/LeHWKZL19},
cites = {0},
citedby = {0},
pages = {7-10},
booktitle = {2nd IEEE 5G World Forum, 5GWF 2019, Dresden, Germany, September 30 - October 2, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3627-1},
}