A testbed and data yields for studying data center energy efficiency and reliability

Due Van Le, Yingbo Liu, Rongrong Wang, Rui Tan, Lek Heng Ngoh. A testbed and data yields for studying data center energy efficiency and reliability. In Jie Gao, Pei Zhang, Shijia Pan, Chien-Chun Ni, editors, Proceedings of the First Workshop on Data Acquisition To Analysis, DATA@SenSys 2018, Shenzhen, China, November 4, 2018. pages 17-18, ACM, 2018. [doi]

Authors

Due Van Le

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Yingbo Liu

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Rongrong Wang

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Rui Tan

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Lek Heng Ngoh

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