A testbed and data yields for studying data center energy efficiency and reliability

Due Van Le, Yingbo Liu, Rongrong Wang, Rui Tan, Lek Heng Ngoh. A testbed and data yields for studying data center energy efficiency and reliability. In Jie Gao, Pei Zhang, Shijia Pan, Chien-Chun Ni, editors, Proceedings of the First Workshop on Data Acquisition To Analysis, DATA@SenSys 2018, Shenzhen, China, November 4, 2018. pages 17-18, ACM, 2018. [doi]

@inproceedings{LeLWTN18,
  title = {A testbed and data yields for studying data center energy efficiency and reliability},
  author = {Due Van Le and Yingbo Liu and Rongrong Wang and Rui Tan and Lek Heng Ngoh},
  year = {2018},
  doi = {10.1145/3277868.3277877},
  url = {https://doi.org/10.1145/3277868.3277877},
  researchr = {https://researchr.org/publication/LeLWTN18},
  cites = {0},
  citedby = {0},
  pages = {17-18},
  booktitle = {Proceedings of the First Workshop on Data Acquisition To Analysis, DATA@SenSys 2018, Shenzhen, China, November 4, 2018},
  editor = {Jie Gao and Pei Zhang and Shijia Pan and Chien-Chun Ni},
  publisher = {ACM},
}