A Novel Approach for Testing Memories Using a Built-In Self Testing Technique - researchr publication

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Kim T. Le, Kewal K. Saluja. A Novel Approach for Testing Memories Using a Built-In Self Testing Technique. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 830-839, IEEE Computer Society, 1986.

Abstract is missing.

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