Son N. Le, Sudarshan K. Srinivasan, Scott C. Smith. Exploiting Dual-Rail Register Invariants for Equivalence Verification of NCL Circuits. In 63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020, Springfield, MA, USA, August 9-12, 2020. pages 21-24, IEEE, 2020. [doi]
@inproceedings{LeSS20-0,
title = {Exploiting Dual-Rail Register Invariants for Equivalence Verification of NCL Circuits},
author = {Son N. Le and Sudarshan K. Srinivasan and Scott C. Smith},
year = {2020},
doi = {10.1109/MWSCAS48704.2020.9184477},
url = {https://doi.org/10.1109/MWSCAS48704.2020.9184477},
researchr = {https://researchr.org/publication/LeSS20-0},
cites = {0},
citedby = {0},
pages = {21-24},
booktitle = {63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020, Springfield, MA, USA, August 9-12, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8058-8},
}