Son N. Le, Sudarshan K. Srinivasan, Scott C. Smith. Exploiting Dual-Rail Register Invariants for Equivalence Verification of NCL Circuits. In 63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020, Springfield, MA, USA, August 9-12, 2020. pages 21-24, IEEE, 2020. [doi]
Abstract is missing.