Bao Le, Dipanjan Sengupta, Andreas G. Veneris, Zissis Poulos. Accelerating post silicon debug of deep electrical faults. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 61-66, IEEE, 2013. [doi]
@inproceedings{LeSVP13,
title = {Accelerating post silicon debug of deep electrical faults},
author = {Bao Le and Dipanjan Sengupta and Andreas G. Veneris and Zissis Poulos},
year = {2013},
doi = {10.1109/IOLTS.2013.6604052},
url = {http://dx.doi.org/10.1109/IOLTS.2013.6604052},
researchr = {https://researchr.org/publication/LeSVP13},
cites = {0},
citedby = {0},
pages = {61-66},
booktitle = {2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013},
publisher = {IEEE},
}