Benjamin C. Lee. Applied statistical inference for system design and management. In 33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015. pages 188-191, IEEE Computer Society, 2015. [doi]
@inproceedings{Lee15-82, title = {Applied statistical inference for system design and management}, author = {Benjamin C. Lee}, year = {2015}, doi = {10.1109/ICCD.2015.7357101}, url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2015.7357101}, researchr = {https://researchr.org/publication/Lee15-82}, cites = {0}, citedby = {0}, pages = {188-191}, booktitle = {33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-7166-7}, }