Pei-Chun Lee. Investigating Patent Value and Litigation Probability of Global Technology Standards. IEEE Trans. Engineering Management, 71:4377-4388, 2024. [doi]
@article{Lee24a,
title = {Investigating Patent Value and Litigation Probability of Global Technology Standards},
author = {Pei-Chun Lee},
year = {2024},
doi = {10.1109/TEM.2022.3208453},
url = {https://doi.org/10.1109/TEM.2022.3208453},
researchr = {https://researchr.org/publication/Lee24a},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Engineering Management},
volume = {71},
pages = {4377-4388},
}