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Pei-Chun Lee. Investigating Patent Value and Litigation Probability of Global Technology Standards. IEEE Trans. Engineering Management, 71:4377-4388, 2024. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Investigating the Knowledge Spillover and Externality of Technology Standards Based on Patent DataPei-Chun Lee. tem, 68(4):1027-1041, 2021. [doi]
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