Chung-Chieh Lee. A Runaway Process Control Mechanism. In Leo F. Zimmerman, John P. Pilch, Linda J. Carroll, Mark Sorkin, Daniel Kaberon, Doug McBride, Frank M. Bereznay, Dale Doolittle, Joel Goldstein, Dave Thorn, Harry Zimmer, Ellen E. Robertson, Peggy De Rossett, Bernard Domanski, Philip Clark, Robert L. Morrison, Edgar A. Ortiz, editors, 17th International Computer Measurement Group Conference, Nashville, TN, USA, December 9-13, 1991, Proceedings. pages 612-619, Computer Measurement Group, 1991.
@inproceedings{Lee91:7,
title = {A Runaway Process Control Mechanism},
author = {Chung-Chieh Lee},
year = {1991},
researchr = {https://researchr.org/publication/Lee91%3A7},
cites = {0},
citedby = {0},
pages = {612-619},
booktitle = {17th International Computer Measurement Group Conference, Nashville, TN, USA, December 9-13, 1991, Proceedings},
editor = {Leo F. Zimmerman and John P. Pilch and Linda J. Carroll and Mark Sorkin and Daniel Kaberon and Doug McBride and Frank M. Bereznay and Dale Doolittle and Joel Goldstein and Dave Thorn and Harry Zimmer and Ellen E. Robertson and Peggy De Rossett and Bernard Domanski and Philip Clark and Robert L. Morrison and Edgar A. Ortiz},
publisher = {Computer Measurement Group},
}