Seoksu Lee, Sangjun An, Eunbi Cho, Eun-Sun Cho. Poster: Automated Generation of a Broad Spectrum of MBA Expressions for Robust Deobfuscation Analysis. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2026, Daejeon, Republic of Korea, May 18-22, 2026. pages 336-339, IEEE, 2026. [doi]
Abstract is missing.