Statistical Multiframes Accuracy Methodology For Attendance Marking System - researchr publication authors

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Kuan-Heng Lee, Sanjay V. Addicam, Ilya Krylov, Sergei Nosov, Mee Sim Lai, Zhan Qiang Lee, Chung Shien Chai. Statistical Multiframes Accuracy Methodology For Attendance Marking System. In 2019 International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2019, Kaohsiung, Taiwan, November 21-23, 2019. pages 1-5, IEEE, 2019. [doi]

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