Statistical Multiframes Accuracy Methodology For Attendance Marking System - researchr publication related

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Kuan-Heng Lee, Sanjay V. Addicam, Ilya Krylov, Sergei Nosov, Mee Sim Lai, Zhan Qiang Lee, Chung Shien Chai. Statistical Multiframes Accuracy Methodology For Attendance Marking System. In 2019 International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2019, Kaohsiung, Taiwan, November 21-23, 2019. pages 1-5, IEEE, 2019. [doi]

The following publications are possibly variants of this publication:

Statistical Multiframe Methodology with Agnostic Thresholding for Attendance Marking SystemKuan-Heng Lee, Sanjay V. Addicam, Ilya Krylov, Sergei Nosov, Mee Sim Lai, Zhan Qiang Lee, Chung Shien Chai. jise, 37(3):593-604, 2021. [doi]

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