Statistical Multiframe Methodology with Agnostic Thresholding for Attendance Marking System

Kuan-Heng Lee, Sanjay V. Addicam, Ilya Krylov, Sergei Nosov, Mee Sim Lai, Zhan Qiang Lee, Chung Shien Chai. Statistical Multiframe Methodology with Agnostic Thresholding for Attendance Marking System. J. Inf. Sci. Eng., 37(3):593-604, 2021. [doi]

Abstract

Abstract is missing.