Hee Sung Lee, Yongmin Baek, Qiubao Lin, Joseph Minsu Chen, Minseong Park, Doeon Lee, Sihwan Kim, Kyusang Lee. Efficient Defect Identification via Oxide Memristive Crossbar Array Based Morphological Image Processing. Adv. Intell. Syst., 3(2):2000202, 2021. [doi]
Abstract is missing.