An Integral Approach To Reuse Verification Code Towards Post Silicon Test Pattern Generation Design Validation And Analysis For Effective SoC Product Development - researchr publication

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Khim Hou Lee, Seow Pin Andy Chang. An Integral Approach To Reuse Verification Code Towards Post Silicon Test Pattern Generation Design Validation And Analysis For Effective SoC Product Development. In Hamid R. Arabnia, Youngsong Mun, editors, Proceedings of the 2008 International Conference on Embedded Systems & Applications, USA 2008, July 14-17, 2008, Las Vegas, Nevada, USA. pages 214-220, CSREA Press, 2008.

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