Hsien-Hsin S. Lee, Krishnendu Chakrabarty. Test Challenges for 3D Integrated Circuits. IEEE Design & Test of Computers, 26(5):26-35, 2009. [doi]
@article{LeeC09-8,
title = {Test Challenges for 3D Integrated Circuits},
author = {Hsien-Hsin S. Lee and Krishnendu Chakrabarty},
year = {2009},
doi = {10.1109/MDT.2009.125},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2009.125},
tags = {testing},
researchr = {https://researchr.org/publication/LeeC09-8},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {26},
number = {5},
pages = {26-35},
}