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Indirect method for random jitter measurement on SoCs using critical path characterization

Jae-Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham. Indirect method for random jitter measurement on SoCs using critical path characterization. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]

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