Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design - researchr publication authors

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Minji Lee, Changseok Choi, Donghyeon Seo, Byeongjun Bang, Yongseok Kang, Woohyun Paik. Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 332-333, IEEE, 2020. [doi]

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