Minji Lee, Changseok Choi, Donghyeon Seo, Byeongjun Bang, Yongseok Kang, Woohyun Paik. Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 332-333, IEEE, 2020. [doi]
@inproceedings{LeeCSBKP20,
title = {Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design},
author = {Minji Lee and Changseok Choi and Donghyeon Seo and Byeongjun Bang and Yongseok Kang and Woohyun Paik},
year = {2020},
doi = {10.1109/ISOCC50952.2020.9332987},
url = {https://doi.org/10.1109/ISOCC50952.2020.9332987},
researchr = {https://researchr.org/publication/LeeCSBKP20},
cites = {0},
citedby = {0},
pages = {332-333},
booktitle = {International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8331-2},
}