Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection

Jaeeun Lee, Hongseok Choi, Kyeongmin Yum, Jungwon Park, JongNam Kim. Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection. J. Imaging, 9(8):156, 2023. [doi]

Abstract

Abstract is missing.