Chi-Woo Lee, Isabelle Ferain, Aryan Afzalian, Ran Yan, Nima Dehdashti, Pedram Razavi, Jean-Pierre Colinge, Jong-Tae Park. NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs. Microelectronics Reliability, 49(9-11):1044-1047, 2009. [doi]
Abstract is missing.