Patricia S. Lee, Ian G. Harris. Test generation for subtractive specification errors. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 258-263, IEEE, 2012. [doi]
@inproceedings{LeeH12-25,
title = {Test generation for subtractive specification errors},
author = {Patricia S. Lee and Ian G. Harris},
year = {2012},
doi = {10.1109/VTS.2012.6231063},
url = {http://dx.doi.org/10.1109/VTS.2012.6231063},
researchr = {https://researchr.org/publication/LeeH12-25},
cites = {0},
citedby = {0},
pages = {258-263},
booktitle = {30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012},
publisher = {IEEE},
isbn = {978-1-4673-1074-1},
}